Subwavelength optical microscopy in the far field

dc.creator	Sun, Qingqing
dc.creator	Al-Amri, M.
dc.creator	Scully, Marlan O.
dc.creator	Zubairy, M. Suhail.
dc.date.accessioned	2011-09-08T21:36:47Z
dc.date.available	2011-09-08T21:36:47Z
dc.date.issued	2011
dc.identifier.citation	Qingqing Sun, M. Al-Amri, Marlan O. Scully and M. Suhail Zubairy. Phys.Rev.A 83 063818 2011. "Copyright (2011) by the American Physical Society."	en
dc.identifier.uri	http://dx.doi.org/10.1103/PhysRevA.83.063818
dc.identifier.uri	https://hdl.handle.net/1969.1/126652
dc.description	Journals published by the American Physical Society can be found at http://publish.aps.org/	en
dc.description.abstract	We present a procedure for subwavelength optical microscopy. The identical atoms are distributed on a plane and shined with a standing wave. We rotate the plane to different angles and record the resonant fluorescence spectra in the far field, from which we can obtain their distance and location information. This procedure also works for atomic separation above one wavelength and therefore provides a seamless microscopy.	en
dc.language.iso	en
dc.publisher	American Physical Society
dc.subject	QUANTUM MICROSCOPY	en
dc.subject	DIFFRACTION	en
dc.subject	RESOLUTION	en
dc.subject	LITHOGRAPHY	en
dc.subject	ATOMS	en
dc.subject	Optics	en
dc.subject	Physics	en
dc.title	Subwavelength optical microscopy in the far field	en
dc.type	Article	en
local.department	Physics and Astronomy	en